Path Delay Fault Testable Modified Booth Multipliers
نویسندگان
چکیده
Testing of Modified Booth Multipliers (MBMs) with respect to path delay faults, is studied in this paper. Design modifications are proposed and a path selection method is suggested. The selected paths are Single Path Propagating – Hazard Free Robustly Testable (SPPHFRT) and based on their delays the delay along any other path of the MBM can be calculated. The number of the selected paths is impressively small compared to all paths of the multiplier. The delay and hardware overhead imposed by the modifications are respectively negligible and small.
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